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History

matejcik 81a03edf61 python/debuglink: add docstrings, rename functions for clearer usage		2020-02-12 15:38:18 +01:00
..
burn_tests	tests: move burn tests to root	2019-08-12 12:57:25 +02:00
click_tests	tests: increase timeout for 16-of-16-share test	2020-01-27 20:17:52 +01:00
device_tests	python/debuglink: add docstrings, rename functions for clearer usage	2020-02-12 15:38:18 +01:00
emulators	tests/upgrade tests: patch emulators on NixOS	2019-10-22 13:59:26 +02:00
fido_tests	ci/tests: disable test_LongEcho in HIDTest, remove retry	2020-01-23 12:26:43 +00:00
persistence_tests	python/debuglink: add docstrings, rename functions for clearer usage	2020-02-12 15:38:18 +01:00
txcache	common: add Peercoin, regenerate coins	2019-12-05 09:43:32 +00:00
ui_tests	tests/ui: regenerate records	2020-02-07 11:41:03 +00:00
upgrade_tests	tests: make use of new emulator code in emulator tests	2020-01-23 18:45:57 +01:00
__init__.py	tests: start moving common functions to top level	2019-09-12 14:29:33 +02:00
.gitignore	tests: ignore trezor.log	2020-02-10 12:36:53 +01:00
buttons.py	tests: click tests for basic and advanced slip39	2019-11-05 11:13:46 +01:00
common.py	tests: introduce UI tests for core	2020-01-03 14:28:27 +00:00
conftest.py	tests: fix style	2020-02-10 15:44:13 +01:00
device_handler.py	core: improve emulator wrapper	2019-10-22 17:06:49 +02:00
download_emulators.sh	tests/upgrade tests: patch emulators on NixOS	2019-10-22 13:59:26 +02:00
emulators.py	tests: make use of new emulator code in emulator tests	2020-01-23 18:45:57 +01:00
README.md	docs: move docs to root	2019-12-06 12:24:20 +00:00
REGISTERED_MARKERS	Revert "tests: add 'timeout' to markers"	2020-01-28 14:45:47 +00:00
trezor.sdcard.gz	core: improve emulator wrapper	2019-10-22 17:06:49 +02:00
tx_cache.py	tests: start moving common functions to top level	2019-09-12 14:29:33 +02:00

README.md

Tests

Burn tests

These tests are doing a simple read/write operations on the device to see if the hardware can endure high number of flash writes. Meant to be run on the device directly for a long period of time.

Device tests

Device tests are integration tests that can be run against either emulator or on an actual device. You are responsible to provide either an emulator or a device with Debug mode present.

Device tests

The original version of device tests. These tests can be run against both Model One and Model T.

See device-tests.md for instructions how to run it.

UI tests

UI tests use device tests and take screenshots of every screen change and compare them against fixtures. Currently for model T only.

See ui-tests.md for more info.

Click tests

Click tests are a next-generation of the Device tests. The tests are quite similar, but they are capable of imitating user's interaction with the screen.

Fido tests

Implement U2F/FIDO2 tests.

Upgrade tests

These tests test upgrade from one firmware version to another. They initialize an emulator on some specific version and then pass its storage to another version to see if the firmware operates as expected. They use fixtures from https://firmware.corp.sldev.cz/upgrade_tests/ which can be downloaded using the download_emulators.sh script.

See the upgrade-tests.md for instructions how to run it.

Persistence tests

These tests test the Persistence mode, which is currently used in the device recovery. These tests launch the emulator themselves and they are capable of restarting or stopping it simulating user's plugging in or plugging out the device.