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trezor-firmware/tests
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Andrew Kozlik e38ced8c05 tests/u2f-hid: Disable strict timing checks in HIDTest and increase receive timeout to avoid failures in CI when emulator is slow to respond.
2020-04-06 09:53:42 +02:00
..
burn_tests tests: move burn tests to root 2019-08-12 12:57:25 +02:00
click_tests tests: remove explicit timeouts from test suite 2020-03-09 10:31:17 +01:00
device_tests tests: streamline TrezorFailure exception usage 2020-03-26 11:30:06 +01:00
emulators tests/upgrade tests: patch emulators on NixOS 2019-10-22 13:59:26 +02:00
fido_tests tests/u2f-hid: Disable strict timing checks in HIDTest and increase receive timeout to avoid failures in CI when emulator is slow to respond. 2020-04-06 09:53:42 +02:00
persistence_tests python/debuglink: add docstrings, rename functions for clearer usage 2020-02-12 15:38:18 +01:00
txcache tests: rework tx cache 2020-03-26 11:30:06 +01:00
ui_tests tests: update SD card test 2020-03-20 14:03:28 +01:00
upgrade_tests all: do not send state in PassphraseAck (not needed for compatibility) 2020-02-13 15:44:50 +01:00
__init__.py tests: start moving common functions to top level 2019-09-12 14:29:33 +02:00
.gitignore tests: ignore trezor.log 2020-02-10 12:36:53 +01:00
bip32.py python: move out deprecated ckd_public 2020-03-26 11:30:06 +01:00
buttons.py tests: click tests for basic and advanced slip39 2019-11-05 11:13:46 +01:00
common.py tests: introduce UI tests for core 2020-01-03 14:28:27 +00:00
conftest.py tests/ui: create report what differs from master 2020-03-04 13:41:32 +01:00
device_handler.py core: improve emulator wrapper 2019-10-22 17:06:49 +02:00
download_emulators.sh tests/upgrade tests: patch emulators on NixOS 2019-10-22 13:59:26 +02:00
emulators.py core/sdcard: make allocating new SD card for emulator fast 2020-02-20 12:51:48 +01:00
README.md docs: move docs to root 2019-12-06 12:24:20 +00:00
REGISTERED_MARKERS Revert "tests: add 'timeout' to markers" 2020-01-28 14:45:47 +00:00
tx_cache.py python: move json_to_tx to btc.from_json, add test cases 2020-03-26 11:30:06 +01:00

README.md

Tests

Burn tests

These tests are doing a simple read/write operations on the device to see if the hardware can endure high number of flash writes. Meant to be run on the device directly for a long period of time.

Device tests

Device tests are integration tests that can be run against either emulator or on an actual device. You are responsible to provide either an emulator or a device with Debug mode present.

Device tests

The original version of device tests. These tests can be run against both Model One and Model T.

See device-tests.md for instructions how to run it.

UI tests

UI tests use device tests and take screenshots of every screen change and compare them against fixtures. Currently for model T only.

See ui-tests.md for more info.

Click tests

Click tests are a next-generation of the Device tests. The tests are quite similar, but they are capable of imitating user's interaction with the screen.

Fido tests

Implement U2F/FIDO2 tests.

Upgrade tests

These tests test upgrade from one firmware version to another. They initialize an emulator on some specific version and then pass its storage to another version to see if the firmware operates as expected. They use fixtures from https://firmware.corp.sldev.cz/upgrade_tests/ which can be downloaded using the download_emulators.sh script.

See the upgrade-tests.md for instructions how to run it.

Persistence tests

These tests test the Persistence mode, which is currently used in the device recovery. These tests launch the emulator themselves and they are capable of restarting or stopping it simulating user's plugging in or plugging out the device.