mirror of https://github.com/trezor/trezor-firmware.git synced 2024-11-12 10:39:00 +00:00

History

matejcik 3c128cde38 tests: fix wait_layout() behavior		2020-06-04 16:18:46 +02:00
..
burn_tests	tests: move burn tests to root	2019-08-12 12:57:25 +02:00
click_tests	tests: remove explicit timeouts from test suite	2020-03-09 10:31:17 +01:00
device_tests	tests: fix wait_layout() behavior	2020-06-04 16:18:46 +02:00
emulators	tests/upgrade tests: patch emulators on NixOS	2019-10-22 13:59:26 +02:00
fido_tests	tests/u2f-hid: Disable strict timing checks in HIDTest and increase receive timeout to avoid failures in CI when emulator is slow to respond.	2020-04-06 09:53:42 +02:00
persistence_tests	core: use ButtonRequestType.PinEntry for PIN entry	2020-06-04 16:18:46 +02:00
txcache	tests: rework tx cache	2020-03-26 11:30:06 +01:00
ui_tests	tests: update UI test fixtures	2020-06-04 16:18:46 +02:00
upgrade_tests	tests: fix wait_layout() behavior	2020-06-04 16:18:46 +02:00
__init__.py	tests: start moving common functions to top level	2019-09-12 14:29:33 +02:00
.gitignore	tests: ignore trezor.log	2020-02-10 12:36:53 +01:00
bip32.py	python: move out deprecated ckd_public	2020-03-26 11:30:06 +01:00
buttons.py	tests: click tests for basic and advanced slip39	2019-11-05 11:13:46 +01:00
common.py	tests: rename test_address to get_test_address	2020-06-04 16:18:46 +02:00
conftest.py	tests: cleaner way to get the ui parameter	2020-06-04 16:18:46 +02:00
device_handler.py	tests: fix wait_layout() behavior	2020-06-04 16:18:46 +02:00
download_emulators.sh	tests/upgrade tests: patch emulators on NixOS	2019-10-22 13:59:26 +02:00
emulators.py	core/sdcard: make allocating new SD card for emulator fast	2020-02-20 12:51:48 +01:00
README.md	docs: move docs to root	2019-12-06 12:24:20 +00:00
REGISTERED_MARKERS	all: drop Capricoin support [NO BACKPORT]	2020-03-20 14:19:30 +00:00
tx_cache.py	python: move json_to_tx to btc.from_json, add test cases	2020-03-26 11:30:06 +01:00

README.md

Tests

Burn tests

These tests are doing a simple read/write operations on the device to see if the hardware can endure high number of flash writes. Meant to be run on the device directly for a long period of time.

Device tests

Device tests are integration tests that can be run against either emulator or on an actual device. You are responsible to provide either an emulator or a device with Debug mode present.

Device tests

The original version of device tests. These tests can be run against both Model One and Model T.

See device-tests.md for instructions how to run it.

UI tests

UI tests use device tests and take screenshots of every screen change and compare them against fixtures. Currently for model T only.

See ui-tests.md for more info.

Click tests

Click tests are a next-generation of the Device tests. The tests are quite similar, but they are capable of imitating user's interaction with the screen.

Fido tests

Implement U2F/FIDO2 tests.

Upgrade tests

These tests test upgrade from one firmware version to another. They initialize an emulator on some specific version and then pass its storage to another version to see if the firmware operates as expected. They use fixtures from https://firmware.corp.sldev.cz/upgrade_tests/ which can be downloaded using the download_emulators.sh script.

See the upgrade-tests.md for instructions how to run it.

Persistence tests

These tests test the Persistence mode, which is currently used in the device recovery. These tests launch the emulator themselves and they are capable of restarting or stopping it simulating user's plugging in or plugging out the device.