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mirror of https://github.com/trezor/trezor-firmware.git synced 2024-12-19 12:58:13 +00:00
trezor-firmware/tests
2020-06-30 15:19:31 +02:00
..
burn_tests tests: move burn tests to root 2019-08-12 12:57:25 +02:00
click_tests core: fix artifacts in click-based UI tests 2020-06-04 16:18:46 +02:00
device_tests all: implement support for pre-overwinter prevtx (fixes #1030) 2020-06-30 15:19:31 +02:00
emulators tests/upgrade tests: patch emulators on NixOS 2019-10-22 13:59:26 +02:00
fido_tests tests/u2f-hid: Disable strict timing checks in HIDTest and increase receive timeout to avoid failures in CI when emulator is slow to respond. 2020-04-06 09:53:42 +02:00
persistence_tests core: use ButtonRequestType.PinEntry for PIN entry 2020-06-04 16:18:46 +02:00
txcache all: implement support for pre-overwinter prevtx (fixes #1030) 2020-06-30 15:19:31 +02:00
ui_tests tests: add missing UI fixture 2020-06-30 15:19:31 +02:00
upgrade_tests core: forbid all settings if not initialized 2020-06-11 18:47:01 +02:00
__init__.py tests: start moving common functions to top level 2019-09-12 14:29:33 +02:00
.gitignore tests: ignore trezor.log 2020-02-10 12:36:53 +01:00
bip32.py python: move out deprecated ckd_public 2020-03-26 11:30:06 +01:00
buttons.py tests: click tests for basic and advanced slip39 2019-11-05 11:13:46 +01:00
common.py tests: rename test_address to get_test_address 2020-06-04 16:18:46 +02:00
conftest.py tests: cleaner way to get the ui parameter 2020-06-04 16:18:46 +02:00
device_handler.py tests: fix wait_layout() behavior 2020-06-04 16:18:46 +02:00
download_emulators.sh Revert "tests: do not check internal firmware.corp certificate" 2020-06-27 14:50:14 +00:00
emulators.py core/sdcard: make allocating new SD card for emulator fast 2020-02-20 12:51:48 +01:00
README.md docs: move docs to root 2019-12-06 12:24:20 +00:00
REGISTERED_MARKERS all: drop Capricoin support [NO BACKPORT] 2020-03-20 14:19:30 +00:00
tx_cache.py python: move json_to_tx to btc.from_json, add test cases 2020-03-26 11:30:06 +01:00

Tests

Burn tests

These tests are doing a simple read/write operations on the device to see if the hardware can endure high number of flash writes. Meant to be run on the device directly for a long period of time.

Device tests

Device tests are integration tests that can be run against either emulator or on an actual device. You are responsible to provide either an emulator or a device with Debug mode present.

Device tests

The original version of device tests. These tests can be run against both Model One and Model T.

See device-tests.md for instructions how to run it.

UI tests

UI tests use device tests and take screenshots of every screen change and compare them against fixtures. Currently for model T only.

See ui-tests.md for more info.

Click tests

Click tests are a next-generation of the Device tests. The tests are quite similar, but they are capable of imitating user's interaction with the screen.

Fido tests

Implement U2F/FIDO2 tests.

Upgrade tests

These tests test upgrade from one firmware version to another. They initialize an emulator on some specific version and then pass its storage to another version to see if the firmware operates as expected. They use fixtures from https://firmware.corp.sldev.cz/upgrade_tests/ which can be downloaded using the download_emulators.sh script.

See the upgrade-tests.md for instructions how to run it.

Persistence tests

These tests test the Persistence mode, which is currently used in the device recovery. These tests launch the emulator themselves and they are capable of restarting or stopping it simulating user's plugging in or plugging out the device.